Browsing by Author "Kenya Agriculture Research institute P.O Box 30148 Nairobi Kenya."
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Item Measurement of Yield Losses Caused by Maize Streak Disease(1978) Guthrie, E.J.; Kenya Agriculture Research institute P.O Box 30148 Nairobi Kenya.In trials at Muguga, Kenya in 1975-6 the effect of maize streak virus on the yield on maize cv. H512 was studied. Under natural infection 19 out of 360 plants were infected and the mean grain yield was reduced by 33.3% from 156.3 to 104.3 g. When infected artificially at the 1st leaf stage grain yield was reduced by 61% from 158.5 to 61.3 g. A significant relationship was found between the stage of the plant at infection and the yield loss. Yield losses ranged from 55.3% at the 2nd leaf stage to 24.9% at the 10th leaf stage (75.7 and 127.3 g, resp. compared with 169.4 g/plant for the controls). ADDITIONAL ABSTRACT:Yield reduction of maize infected with maize streak virus was measured under field conditions at Muguga, Kenya. Losses were 25-60%. There was a strong correlation between time of infection and yield loss.
